Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 1986

Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery

D. Tenorio
  • Function : Author
M. Bordas
  • Function : Author
J. Larcher
  • Function : Author
G. Lagarde
  • Function : Author
A. Jaidar
  • Function : Author
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in2p3-00006387 , version 1 (03-10-2000)

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  • HAL Id : in2p3-00006387 , version 1

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D. Tenorio, G. Costa, M. Bordas, J. Larcher, G. Lagarde, et al.. Thick target x-ray yields and intensity ratios for MeV Br and Kr ion impact and application to the analysis of ottery. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986, 15, pp.612. ⟨in2p3-00006387⟩
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