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Light elements quantitative X-ray microanalysis of thin samples in STEM, absorption correction using EELS data

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http://hal.in2p3.fr/in2p3-00012887
Contributor : Jeanine Pellet Connect in order to contact the contributor
Submitted on : Monday, June 23, 2003 - 11:15:20 AM
Last modification on : Thursday, December 16, 2021 - 2:10:20 PM

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  • HAL Id : in2p3-00012887, version 1

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V. Banchet, J. Michel, Edouard Jallot, D. Laurent-Maquin, G. Balossier. Light elements quantitative X-ray microanalysis of thin samples in STEM, absorption correction using EELS data. Journal of Physics D: Applied Physics, IOP Publishing, 2003, 36, pp.1599-1604. ⟨in2p3-00012887⟩

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