Mass measurement of secondary ions of A=100 in the vicinity of $^{100}$Sn using the second cyclotron of GANIL - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Conference Papers Year : 1995

Mass measurement of secondary ions of A=100 in the vicinity of $^{100}$Sn using the second cyclotron of GANIL

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in2p3-00014583 , version 1 (11-05-1999)

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  • HAL Id : in2p3-00014583 , version 1

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A. Lepine-Szily, G. Auger, W. Mittig, M. Chartier, D. Bibet, et al.. Mass measurement of secondary ions of A=100 in the vicinity of $^{100}$Sn using the second cyclotron of GANIL. International Conference On Exotic Nuclei And Atomic Masses ENAM 95, 1995, Arles, France. pp.79-84. ⟨in2p3-00014583⟩
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