 |
Journal articles
Electrically active defects in detector-grade CdTe:Cl and CdZnTe materials grown by THM and HpBm
http://hal.in2p3.fr/in2p3-00015150
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, March 24, 2000 - 4:34:02 PM
Last modification on : Thursday, April 23, 2020 - 2:26:18 PM
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, March 24, 2000 - 4:34:02 PM
Last modification on : Thursday, April 23, 2020 - 2:26:18 PM