Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 1990

Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons

A.P. Georgiadis
  • Function : Author
D. Apostolakis
  • Function : Author
M. Vourkas
  • Function : Author
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in2p3-00015455 , version 1 (04-05-2000)

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  • HAL Id : in2p3-00015455 , version 1

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A.P. Georgiadis, D. Apostolakis, M. Vourkas, A. Pape. Sensitivity of trace-element analysis by X-ray emission induced by 0.1-10 MeV electrons. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990, 50, pp.321. ⟨in2p3-00015455⟩
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