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A simple procedure based on the pcd method for determination of recombination lifetime and surface recombination velocity in silicon

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http://hal.in2p3.fr/in2p3-00015643
Contributor : Yvette Heyd Connect in order to contact the contributor
Submitted on : Friday, May 19, 2000 - 9:13:10 AM
Last modification on : Thursday, April 23, 2020 - 2:26:18 PM

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  • HAL Id : in2p3-00015643, version 1

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J.C. Fontaine, S. Barthe, J.P. Ponpon, J.P. Schunck, P. Siffert. A simple procedure based on the pcd method for determination of recombination lifetime and surface recombination velocity in silicon. Measurement Science and Technology, IOP Publishing, 1994, 5, pp.47-50. ⟨in2p3-00015643⟩

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