Ar ion induced X-ray emission for the analysis of light elements in CdTe - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Conference Papers Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 1992

Ar ion induced X-ray emission for the analysis of light elements in CdTe

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in2p3-00015880 , version 1 (30-05-2000)

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  • HAL Id : in2p3-00015880 , version 1

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A. Al-Neami, A.K. Al-Neami, M. Bordas, M. Hage-Ali, J. Larcher, et al.. Ar ion induced X-ray emission for the analysis of light elements in CdTe. Spring Meeting of the European Materials Research Society (E-Mrs) Symposium C on High Energy Ion Implantation Symposium D on Ion Beam Synthesis of Compound and Element Layers Symposium F on Nuclear Methods in Semiconductor Physics, May 1991, Strasbourg, France. pp.71-76. ⟨in2p3-00015880⟩
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