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Journal Articles Physical Review B: Condensed Matter and Materials Physics (1998-2015) Year : 1992

Defect reactions in copper-diffused and quenched p-type silicon

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in2p3-00015892 , version 1 (30-05-2000)

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  • HAL Id : in2p3-00015892 , version 1

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A. Mesli, T. Heiser. Defect reactions in copper-diffused and quenched p-type silicon. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 1992, 45, pp.11632-11641. ⟨in2p3-00015892⟩
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