The combined use of a singly charged ion beam and undulator radiation for photoelectron spectrometry studies on atomic ions - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Review of Scientific Instruments Year : 1992

The combined use of a singly charged ion beam and undulator radiation for photoelectron spectrometry studies on atomic ions

J.M. Bizau
  • Function : Author
D. Cubaynes
  • Function : Author
M. Richter
  • Function : Author
F. Wuillemer
  • Function : Author
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Dates and versions

in2p3-00016201 , version 1 (03-07-2000)

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  • HAL Id : in2p3-00016201 , version 1

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J.M. Bizau, D. Cubaynes, M. Richter, F. Wuillemer, J. Obert, et al.. The combined use of a singly charged ion beam and undulator radiation for photoelectron spectrometry studies on atomic ions. Review of Scientific Instruments, 1992, 63, pp.1389-1392. ⟨in2p3-00016201⟩
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