Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Year : 1991

Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer

I. Hietanen
  • Function : Author
J. Lindgren
  • Function : Author
R. Orava
  • Function : Author
T. Tuuva
  • Function : Author
R. Brenner
  • Function : Author
M. Andersson
  • Function : Author
K. Leinonen
  • Function : Author
H. Ronkainen
  • Function : Author
L. Hubbeling
  • Function : Author
M. Turala
  • Function : Author
P. Weilhammer
  • Function : Author
W. Dulinski
  • Function : Author
D. Husson
  • Function : Author
A. Lounis
  • Function : Author
M. Schffer
  • Function : Author
R. Turchetta
  • Function : Author
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Dates and versions

in2p3-00017884 , version 1 (23-10-2000)

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  • HAL Id : in2p3-00017884 , version 1

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I. Hietanen, J. Lindgren, R. Orava, T. Tuuva, R. Brenner, et al.. Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991, 305, pp.173-176. ⟨in2p3-00017884⟩
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