Beam test results of an ion-implanted silicon strip detector on a 100 mm wafer
I. Hietanen
,
J. Lindgren
,
R. Orava
,
T. Tuuva
,
R. Brenner
,
M. Andersson
,
K. Leinonen
,
H. Ronkainen
,
L. Hubbeling
,
M. Turala
,
P. Weilhammer
,
W. Dulinski
,
D. Husson
,
A. Lounis
,
M. Schffer
,
R. Turchetta
,
J. Chauveau
(1)
I. Hietanen
- Function : Author
J. Lindgren
- Function : Author
R. Orava
- Function : Author
T. Tuuva
- Function : Author
R. Brenner
- Function : Author
M. Andersson
- Function : Author
K. Leinonen
- Function : Author
H. Ronkainen
- Function : Author
L. Hubbeling
- Function : Author
M. Turala
- Function : Author
P. Weilhammer
- Function : Author
W. Dulinski
- Function : Author
D. Husson
- Function : Author
A. Lounis
- Function : Author
M. Schffer
- Function : Author
R. Turchetta
- Function : Author