Argon ion induced X-ray analysis of silicon and chlorine in cadmium telluride - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Journal of Radioanalytical Chemistry Year : 1980

Argon ion induced X-ray analysis of silicon and chlorine in cadmium telluride

G. Lagarde
  • Function : Author
C. Scharager
  • Function : Author
D. Tenorio
  • Function : Author
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Dates and versions

in2p3-00017898 , version 1 (26-10-2000)

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  • HAL Id : in2p3-00017898 , version 1

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J. Cailleret, C. Heitz, G. Lagarde, C. Scharager, P. Siffert, et al.. Argon ion induced X-ray analysis of silicon and chlorine in cadmium telluride. Journal of Radioanalytical Chemistry, 1980, 55, pp.339-344. ⟨in2p3-00017898⟩
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