Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS

J. Cailleret; C. Heitz; G. Lagarde; D. Tenorio; C. Scharager; R. Stuck; P. Siffert

Conference Papers Nuclear Instruments and Methods Year : 1980

Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS

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1

J. Cailleret

Function : Author

Institut de Recherches Subatomiques

C. Heitz

Function : Author

Institut de Recherches Subatomiques

G. Lagarde

Function : Author

D. Tenorio

Function : Author

C. Scharager

Function : Author

R. Stuck

Function : Author

Institut de Recherches Subatomiques

P. Siffert

Function : Author

Institut de Recherches Subatomiques

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in2p3-00017913 , version 1 (27-10-2000)

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J. Cailleret, C. Heitz, G. Lagarde, D. Tenorio, C. Scharager, et al.. Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS. International Conference on Ion Beam Analysis 4, Jun 1979, Aarhus, Denmark. pp.367-371. ⟨in2p3-00017913⟩

Trace analysis in cadmium telluride by heavy ion induced X-ray emission and by SIMS

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