Surface analysis by argon ion induced X-ray fluorescence - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Conference Papers Nuclear Instruments and Methods Year : 1978

Surface analysis by argon ion induced X-ray fluorescence

M. Kwadow
  • Function : Author
D. Tenorio
  • Function : Author
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Dates and versions

in2p3-00018018 , version 1 (07-11-2000)

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  • HAL Id : in2p3-00018018 , version 1

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C. Heitz, M. Kwadow, D. Tenorio. Surface analysis by argon ion induced X-ray fluorescence. International Conference on Ion Beam Analysis 3, Jun 1977, Washington, United States. pp.483-488. ⟨in2p3-00018018⟩
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