Interface studies of metal-semiconductor contacts by means of SIMs nuclear reaction and RBS - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Conference Papers Nuclear Instruments and Methods Year : 1978

Interface studies of metal-semiconductor contacts by means of SIMs nuclear reaction and RBS

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in2p3-00018024 , version 1 (08-11-2000)

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  • HAL Id : in2p3-00018024 , version 1

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J.P. Ponpon, J.J. Grob, A. Grob, R. Stuck, P. Siffert. Interface studies of metal-semiconductor contacts by means of SIMs nuclear reaction and RBS. International Conference on Ion Beam Analysis 3, Jun 1977, Washington, United States. pp.647-651. ⟨in2p3-00018024⟩
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