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Journal Articles Applied Physics Year : 1979

Studies of CdTe surfaces with secondary ion mass spectrometry, Rutherford backscattering and ellipsometry

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in2p3-00018429 , version 1 (20-12-2000)

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  • HAL Id : in2p3-00018429 , version 1

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M. Hage-Ali, R. Stuck, A.N. Saxena, P. Siffert. Studies of CdTe surfaces with secondary ion mass spectrometry, Rutherford backscattering and ellipsometry. Applied Physics, 1979, 19, pp.25-33. ⟨in2p3-00018429⟩
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