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Journal Articles Nuclear Instruments and Methods Year : 1973

Thin dE/dx detector of uniform thickness made on epitaxial silicon

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Instrumentation and Detectors [physics.ins-det]

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https://hal.in2p3.fr/in2p3-00018474

Submitted on : Friday, December 22, 2000-8:02:32 AM

Last modification on : Friday, June 2, 2023-3:36:26 PM

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in2p3-00018474 , version 1 (22-12-2000)

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  • HAL Id : in2p3-00018474 , version 1

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J.P. Ponpon, P. Siffert, F. Vazeille. Thin dE/dx detector of uniform thickness made on epitaxial silicon. Nuclear Instruments and Methods, 1973, 112, pp.465-467. ⟨in2p3-00018474⟩

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