Hard photon yields from (70-240) GeV electrons incident near axial directions on Si, Ge and W single crystals with a large thickness variation - Archive ouverte HAL Access content directly
Journal Articles Physics Letters B Year : 1990

Hard photon yields from (70-240) GeV electrons incident near axial directions on Si, Ge and W single crystals with a large thickness variation

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R. Medenwaldt
  • Function : Author
S.P. Mooler
  • Function : Author
S. Tang-Petersen
  • Function : Author
E. Uggerhoj
  • Function : Author
K. Elsener
  • Function : Author
P. Sona
  • Function : Author
K. Maier
  • Function : Author
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Dates and versions

in2p3-00019448 , version 1 (30-05-2001)

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  • HAL Id : in2p3-00019448 , version 1

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R. Medenwaldt, S.P. Mooler, S. Tang-Petersen, E. Uggerhoj, K. Elsener, et al.. Hard photon yields from (70-240) GeV electrons incident near axial directions on Si, Ge and W single crystals with a large thickness variation. Physics Letters B, 1990, 242, pp.517-522. ⟨in2p3-00019448⟩
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