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Journal Articles Progress in Crystal Growth and Characterization of Materials Year : 1984

Secondary ion mass spectrometry (SIMS)

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in2p3-00019470 , version 1 (31-05-2001)

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  • HAL Id : in2p3-00019470 , version 1

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R. Stuck, P. Siffert. Secondary ion mass spectrometry (SIMS). Progress in Crystal Growth and Characterization of Materials, 1984, 8, pp.11-57. ⟨in2p3-00019470⟩
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