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Conference Papers Year : 1976

Defects introduced in silicon by irradiation with muons of gev energy

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in2p3-00019491 , version 1 (31-05-2001)

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  • HAL Id : in2p3-00019491 , version 1

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J.C. Muller, P. Siffert, H.M. Heijne. Defects introduced in silicon by irradiation with muons of gev energy. International Conference On Radiation Effects In Semiconductors, Sep 1976, Dubrovnik, pp.505-506. ⟨in2p3-00019491⟩
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