Half-life measurements for $^{61}$Ga, $^{63}$Ge, and $^{65}$As and their importance in the rp process - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Physical Review C Year : 1993

Half-life measurements for $^{61}$Ga, $^{63}$Ge, and $^{65}$As and their importance in the rp process

J.A. Winger
  • Function : Author
D.P. Bazin
  • Function : Author
W. Benenson
  • Function : Author
G.M. Crawley
  • Function : Author
D.J. Morrissey
  • Function : Author
N.A. Orr
R. Pfaff
  • Function : Author
B.M. Sherrill
  • Function : Author
M. Thoennessen
  • Function : Author
S.J. Yennello
  • Function : Author
B.M. Young
  • Function : Author
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Dates and versions

in2p3-00019777 , version 1 (08-02-2002)

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  • HAL Id : in2p3-00019777 , version 1

Cite

J.A. Winger, D.P. Bazin, W. Benenson, G.M. Crawley, D.J. Morrissey, et al.. Half-life measurements for $^{61}$Ga, $^{63}$Ge, and $^{65}$As and their importance in the rp process. Physical Review C, 1993, 48, pp.3097-3105. ⟨in2p3-00019777⟩
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