Self-consistent isotopic comparative method used to determine dependence of secondary-ion yields on oxygen concentration in Si-O system up to 33 at% - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Surface and Interface Analysis Year : 2013

Self-consistent isotopic comparative method used to determine dependence of secondary-ion yields on oxygen concentration in Si-O system up to 33 at%

J.C. Dupuy
  • Function : Author
G. Prudon
  • Function : Author
C. Dubois
  • Function : Author
R. Koegler
  • Function : Author
S. Akhmadaliev
  • Function : Author
A. Perrat-Mabilon
  • Function : Author

Dates and versions

in2p3-00835579 , version 1 (19-06-2013)

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J.C. Dupuy, G. Prudon, C. Dubois, R. Koegler, S. Akhmadaliev, et al.. Self-consistent isotopic comparative method used to determine dependence of secondary-ion yields on oxygen concentration in Si-O system up to 33 at%. Surface and Interface Analysis, 2013, 45, pp.369-372. ⟨10.1002/sia.5108⟩. ⟨in2p3-00835579⟩
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