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Journal Articles Surface and Interface Analysis Year : 2013

Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts

M. J. Eller
  • Function : Author
S. V. Verkhoturov
  • Function : Author
F. A. Fernandez-Lima
  • Function : Author
J. D. Debord
  • Function : Author
E. A. Schweikert
  • Function : Author

Abstract

The use of large cluster primary ions (e.g. C60, Au400) in secondary ion mass spectrometry has become prevalent in recent years due to their enhanced emission of secondary ions, in particular, molecular ions (MW ≤ 1500 Da). The co-emission of electrons with SIs was investigated per projectile impact. It has been found that SI and electrons yields increased with increasing projectile energy and size. The use of the emitted electrons from impacts of C60 for localization has been demonstrated for cholesterol deposited on a copper grid. The instrumentation, methodologies, and results from these experiments are presented.

Dates and versions

in2p3-00842377 , version 1 (08-07-2013)

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M. J. Eller, S. V. Verkhoturov, F. A. Fernandez-Lima, J. D. Debord, E. A. Schweikert, et al.. Simultaneous detection and localization of secondary ions and electrons from single large cluster impacts. Surface and Interface Analysis, 2013, 45, pp.529-531. ⟨10.1002/sia.4949⟩. ⟨in2p3-00842377⟩
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