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Conference Papers Year : 2011

Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data Transmission

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S. Seif El Nasr-Storey
  • Function : Author
S. Detraz
  • Function : Author
P. Gui
  • Function : Author
P. Moreira
  • Function : Author
S. Papadopoulos
  • Function : Author
C. Sigaud
  • Function : Author
C. Soos
  • Function : Author
P. Stejskal
  • Function : Author
J. Troska
  • Function : Author
F. Vasey
  • Function : Author

Abstract

A 63 MeV proton beam was used to perform a single event upset (SEU) test on a candidate component for a future high luminosity large hadron collider (HL-LHC) high speed optical. An in-lab error injector was used to show that 1-0 bit errors are caused by the amplifier's response to the large signal caused by a single event transient (SET) in the photodiode.

Dates and versions

in2p3-00849111 , version 1 (30-07-2013)

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S. Seif El Nasr-Storey, S. Detraz, P. Gui, M. Menouni, P. Moreira, et al.. Single-Event Upsets in Photoreceivers for Multi-Gb/s SLHC Data Transmission. 48th IEEE International Nuclear and Space Radiation Effects Conference (NSREC), Jul 2011, Las Vegas, United States. pp.3111-3117, ⟨10.1109/TNS.2011.2172632⟩. ⟨in2p3-00849111⟩
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