X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Applied Surface Science Year : 2008

X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films

F. Singh
  • Function : Author
G. Govind
  • Function : Author
S. M. Shivaprasad
  • Function : Author
D. K. Avasthi
  • Function : Author
J. C. Pivin
  • Function : Author

Abstract

The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopy are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp(2) to sp(3) conversion) and reduction of pi electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence. (C) 2008 Elsevier B.V. All rights reserved.

Dates and versions

in2p3-00855560 , version 1 (29-08-2013)

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A. Kumar, F. Singh, G. Govind, S. M. Shivaprasad, D. K. Avasthi, et al.. X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films. Applied Surface Science, 2008, 254, pp.7280-7284. ⟨10.1016/j.apsusc.2008.05.322⟩. ⟨in2p3-00855560⟩
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