B. Marchand, N. Moncoffre, y. Pipon, N. Bererd, C. Garnier, et al.. Xenon migration in UO2 under irradiation studied by SIMS profilometry.
NuMat 2012: The Nuclear Materials Conference, Oct 2012, Osaka, Japan. pp.562-567,
⟨10.1016/j.jnucmat.2013.04.005⟩.
⟨in2p3-00861210⟩