A comparison between Geant4 PIXE simulations and experimental data for standard reference samples - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Year : 2013

A comparison between Geant4 PIXE simulations and experimental data for standard reference samples

Z. Francis
  • Function : Author
M. El Bast
  • Function : Author
R. El Haddad
  • Function : Author
A. Mantero
  • Function : Author
S. Incerti
V. Ivanchenko
  • Function : Author
M.A. Bernal
  • Function : Author
M. Roumie
  • Function : Author

Abstract

The Geant4 PIXE de-excitation processes are used to simulate proton beam interactions with sample materials of known composition. Simulations involve four mono-elemental materials; Cu, Fe, Si and Al and three relatively complex materials: stainless steel, phosphor bronze and basal BE-N reference material composed of 25 different elements. The simulation results are compared to experimental spectra acquired for real samples analyzed using 3 MeV incident protons delivered by an ion tandem accelerator. Data acquisition was performed using a Si(Li) detector and an aluminum funny filter was added for the three last mentioned samples depending on the configuration to reduce the noise and obtain clear resulting spectrum. The results show a good agreement between simulations and measurements for the different samples.

Dates and versions

in2p3-00876453 , version 1 (24-10-2013)

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Cite

Z. Francis, M. El Bast, R. El Haddad, A. Mantero, S. Incerti, et al.. A comparison between Geant4 PIXE simulations and experimental data for standard reference samples. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2013, 316, pp.1-5. ⟨10.1016/j.nimb.2013.08.006⟩. ⟨in2p3-00876453⟩
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