Conference Papers
Year : 2013
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https://hal.in2p3.fr/in2p3-00994922
Submitted on : Thursday, May 22, 2014-1:27:40 PM
Last modification on : Friday, June 2, 2023-3:36:25 PM
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- HAL Id : in2p3-00994922 , version 1
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B. Marchand, N. Moncoffre, Y. Pipon, N. Bérerd, C. Garnier, et al.. Comparision of Xe migration in UO2 during thermal annealing and under irradiation. 17Th International Conference on Radiation Effects in Insulators, Jun 2013, Helsinki, Finland. ⟨in2p3-00994922⟩
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