Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Journal of Applied Physics Year : 2015

Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy

Abstract

In order to understand ferromagnetic ordering in SiC-based diluted magnetic semiconductors, Fe-implanted 6H-SiC subsequently annealed was studied by Atom Probe Tomography, Fe-57 Mossbauer spectroscopy and SQUID magnetometry. Thanks to its 3D imaging capabilities at the atomic scale, Atom Probe Tomography appears as the most suitable technique to investigate the Fe distribution in the 6H-SiC host semiconductor and to evidence secondary phases. This study definitely evidences the formation of Fe3Si nano-sized clusters after annealing. These clusters are unambiguously responsible for the main part of the magnetic properties observed in the annealed samples. (c) 2015 AIP Publishing LLC.
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in2p3-01168657 , version 1 (26-06-2015)

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Lindor Diallo, Luc Lechevallier, Abdeslem Fnidiki, Rodrigue Lardé, A. Debelle, et al.. Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy. Journal of Applied Physics, 2015, 117 (issue 18), pp.183907. ⟨10.1063/1.4921056⟩. ⟨in2p3-01168657⟩
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