Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy

Abstract : In order to understand ferromagnetic ordering in SiC-based diluted magnetic semiconductors, Fe-implanted 6H-SiC subsequently annealed was studied by Atom Probe Tomography, Fe-57 Mossbauer spectroscopy and SQUID magnetometry. Thanks to its 3D imaging capabilities at the atomic scale, Atom Probe Tomography appears as the most suitable technique to investigate the Fe distribution in the 6H-SiC host semiconductor and to evidence secondary phases. This study definitely evidences the formation of Fe3Si nano-sized clusters after annealing. These clusters are unambiguously responsible for the main part of the magnetic properties observed in the annealed samples. (c) 2015 AIP Publishing LLC.
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Article dans une revue
Journal of Applied Physics, American Institute of Physics, 2015, 117 (issue 18), pp.183907. 〈10.1063/1.4921056〉
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Contributeur : Emilie Bonnardel <>
Soumis le : vendredi 26 juin 2015 - 12:20:37
Dernière modification le : mercredi 31 janvier 2018 - 12:14:21

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L. Diallo M., L. Lechevallier, A. Fnidiki, R. Larde, A. Debelle, et al.. Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and Fe-57 Mossbauer spectroscopy. Journal of Applied Physics, American Institute of Physics, 2015, 117 (issue 18), pp.183907. 〈10.1063/1.4921056〉. 〈in2p3-01168657〉

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