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Conference papers

High resolution depth profiling of light elements in high atomic mass materials

J.-P. Thomas 1 M. Fallavier 1 D. Ramdane 1 N. Chevarier 1 A. Chevarier 1 
1 IPNL - Institut de Physique Nucléaire de Lyon
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Conference papers
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http://hal.in2p3.fr/in2p3-00004065
Contributor : Sylvie Flores Connect in order to contact the contributor
Submitted on : Wednesday, March 8, 2000 - 9:36:15 AM
Last modification on : Friday, September 10, 2021 - 1:50:04 PM

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  • HAL Id : in2p3-00004065, version 1

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IN2P3 | CNRS | UNIV-LYON1 | IP2I | UDL

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J.-P. Thomas, M. Fallavier, D. Ramdane, N. Chevarier, A. Chevarier. High resolution depth profiling of light elements in high atomic mass materials. International Conference On Ion Beam Analysis 6, May 1983, Tempe, United States. pp.125-128. ⟨in2p3-00004065⟩

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