Structure and low-temperature thermal relaxation of ion-implanted germanium

C.J. Glover; M.C. Ridgway; K.M. Yu; G.J. Foran; C. Clerc; J.L. Hansen; A. Nylandsted-Larsen

Conference Papers Journal of Synchrotron Radiation Year : 2001

Structure and low-temperature thermal relaxation of ion-implanted germanium

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1

C.J. Glover

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M.C. Ridgway

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K.M. Yu

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G.J. Foran

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C. Clerc

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Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse

J.L. Hansen

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A. Nylandsted-Larsen

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Instrumentation and Detectors [physics.ins-det]

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Submitted on : Friday, August 24, 2001-3:56:04 PM

Last modification on : Thursday, April 11, 2024-1:18:11 PM

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in2p3-00010366 , version 1 (24-08-2001)

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HAL Id : in2p3-00010366 , version 1

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C.J. Glover, M.C. Ridgway, K.M. Yu, G.J. Foran, C. Clerc, et al.. Structure and low-temperature thermal relaxation of ion-implanted germanium. International Conference on X-Ray Absorption Fine Structure 11 XAFS XI, Jul 2000, Ako, Japan. pp.773-775. ⟨in2p3-00010366⟩

Structure and low-temperature thermal relaxation of ion-implanted germanium

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