Rte measurement with Xe$^{52+}$ ions channeled in a Si crystal - IN2P3 - Institut national de physique nucléaire et de physique des particules Access content directly
Journal Articles Physics Letters A Year : 1992

Rte measurement with Xe$^{52+}$ ions channeled in a Si crystal

M. Chevallier
C. Cohen
  • Function : Author
N. Cue
  • Function : Author
D. Dauvergne
J. Dural
  • Function : Author
Y. Girard
  • Function : Author
A. L'Hoir
  • Function : Author
Y. Quere
  • Function : Author
Didier Schmaus
  • Function : Author
M. Toulemonde
No file

Dates and versions

in2p3-00013108 , version 1 (17-03-1999)

Identifiers

  • HAL Id : in2p3-00013108 , version 1

Cite

S. Andriamonje, M. Chevallier, C. Cohen, N. Cue, D. Dauvergne, et al.. Rte measurement with Xe$^{52+}$ ions channeled in a Si crystal. Physics Letters A, 1992, 164, pp.184-190. ⟨in2p3-00013108⟩
3 View
0 Download

Share

Gmail Mastodon Facebook X LinkedIn More