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Journal Articles Le Vide Year : 1974

Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon

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https://hal.in2p3.fr/in2p3-00018417

Submitted on : Wednesday, December 20, 2000-1:32:26 PM

Last modification on : Friday, June 2, 2023-3:36:26 PM

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in2p3-00018417 , version 1 (20-12-2000)

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  • HAL Id : in2p3-00018417 , version 1

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J.J. Grob, A. Grob, P. Siffert. Evaluation of heavy ion energy losses in silicon due to a channelling phenomenon. Le Vide, 1974, 29, pp.374-379. ⟨in2p3-00018417⟩

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