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Journal Articles Solid-State Electronics Year : 1974

Thermally stimulated current measurements on silicon junctions produced by implantation of low energy boron ions

J.C. Muller
  • Function : Author
R. Berger
  • Function : Author
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in2p3-00018451 , version 1 (21-12-2000)

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  • HAL Id : in2p3-00018451 , version 1

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J.C. Muller, R. Stuck, R. Berger, P. Siffert. Thermally stimulated current measurements on silicon junctions produced by implantation of low energy boron ions. Solid-State Electronics, 1974, 17, pp.1293-1297. ⟨in2p3-00018451⟩
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