X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA* Phase - IN2P3 - Institut national de physique nucléaire et de physique des particules Accéder directement au contenu
Article Dans Une Revue Ferroelectrics Année : 2006

X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA* Phase

Résumé

We present the X-ray diffraction, polarizing optical microscopy and electrooptic response studies of the chiral liquid crystal siloxane DSi3-MR11 [1] with a de Vries-type behavior. In a wide temperature range (b.Delta T sim 50°C) the material shows no layer shrinkage but a weak nearly linear layer spacing variation with temperature. Neither discontinuity nor slope change occurs at the SmA*-SmC* transition. In addition, using the X-ray data, the unusual electrooptic response in both 1st and 2nd harmonics together with known thermal behavior of birefringence, we evidence the cross-over from the classical orthogonal to the de Vries-like SmA* regime in DSi3-MR11 siloxane.
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Dates et versions

in2p3-00137684 , version 1 (21-03-2007)

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F. Goc, Christophe Blanc, Vladimir Lorman, Maurizio Nobili, S. Samaritani, et al.. X-Ray and Electrooptical Studies of Liquid Crystal Siloxane with a de Vries SmA* Phase. Ferroelectrics, 2006, 343, pp.101-110. ⟨10.1080/00150190600962176⟩. ⟨in2p3-00137684⟩
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