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Journal Articles Surface and Interface Analysis Year : 2013

Characterization of individual nano-objects with nanoprojectile-SIMS

C.K. Liang
  • Function : Author
S. V. Verkhoturov
  • Function : Author
Y. Bisrat
  • Function : Author
S. Dikler
  • Function : Author
J. D. Debord
  • Function : Author
F. A. Fernandez-Lima
  • Function : Author
E. A. Schweikert
  • Function : Author

Abstract

Secondary ion mass spectrometry (SIMS) applied in the event-by-event bombardment/detection mode is uniquely suited for the characterization of individual nano-objects. In this approach, nano-objects are examined one-by-one, allowing for the detection of variations in composition. The validity of the analysis depends upon the ability to physically isolate the nano-objects on a chemically inert support. This requirement can be realized by deposition of the nano-objects on a Nano-Assisted Laser Desorption/Ionization (NALDI™) plate. The featured nanostructured surface provides a support where nano-objects can be isolated if the deposition is performed at a proper concentration. We demonstrate the characterization of individual nano-objects on a NALDI™ plate for two different types of nanometric bacteriophages: Qβ and M13. Scanning electron microscope (SEM) images verified that the integrity of the phages is preserved on the NALDI™ substrate. Mass spectrometric data show secondary ions from the phages are identified and resolved from those from the underlying substrate.

Dates and versions

in2p3-00842429 , version 1 (08-07-2013)

Identifiers

Cite

C.K. Liang, S. V. Verkhoturov, Y. Bisrat, S. Dikler, J. D. Debord, et al.. Characterization of individual nano-objects with nanoprojectile-SIMS. Surface and Interface Analysis, 2013, 45, pp.329-332. ⟨10.1002/sia.5084⟩. ⟨in2p3-00842429⟩
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