In situ Raman spectroscopy for characterization of ion induced defects in model graphite - Archive ouverte HAL Access content directly
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in2p3-02097721 , version 1 (12-04-2019)

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  • HAL Id : in2p3-02097721 , version 1

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N. Galy, N. Moncoffre, N Toulhoat, N. Bérerd, Y Pipon, et al.. In situ Raman spectroscopy for characterization of ion induced defects in model graphite. Numat 2018, Oct 2018, Seattle, United States. ⟨in2p3-02097721⟩
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